Drexel

   Goran Karapetrov

Scanning Probe Microscopy

 

    • Variable Temperature UHV Scanning Probe Microscope AFM/STM (RHK UHV-3500 ). The microscope is equipped with e-beam evaporation system, RGA, and other auxiliary tools that facilitate sample preparation and control under UHV environment. The system is installed in an STC-50 rated acoustic chamber (not shown on the picture).
 

 


 

 

 

  • Bruker Multimode 8 ambient AFM/STM/EC-AFM/EC-STM microscope in acoustic chamber, as well as controlled atmosphere environment (glove box).